Closed-loop testing of LTE base stations

Apr 21, 2010 - Rohde & Schwarz offers comprehensive LTE test solutions. The signal generators of the R&S®SMU family now also support closed-loop LTE base station (eNB) tests via the new R&S®SMx/AMU-K69 options.

To ensure the high data throughput of LTE, the base station conformance test specification (TS 36.141) requires testing of transmitter and receiver characteristics as well as receiver performance under fading conditions. The latter also includes LTE HARQ and timing adjustment tests which require a closed-loop test approach.

To enable users to perform these tests, Rohde & Schwarz offers a flexible one-box solution: the R&S®SMU200A vector signal generator. Equipped with the appropriate options, the instrument generates standard-compliant LTE signals (including channel coding) and simulates the necessary channel conditions (fading and AWGN). Additionally, the new R&S®SMU-K69 LTE closed-loop base station test option now enables the instrument to process the feedback from the base station and to dynamically adapt the generated LTE signal in realtime.

The Rohde & Schwarz solution offers the following benefits:

  • Signal generation in line with LTE standard version 8.7.0 (June 2009 baseline)
  • No additional LTE test user equipment needed in order to perform the TS 36.141 closed-loop base station tests
  • Reliable test results due to excellent signal purity of the Rohde & Schwarz signal generators
  • The R&S®SMU200A requires only a minimum of rack space, incorporating dual-path LTE signal generation and LTE channel simulation within a single instrument of four height units

The LTE closed-loop base station test functionality is also available for the Rohde & Schwarz signal generators R&S®SMJ100A, R&S®SMATE200A (via the R&S®SMx-K69 option) and R&S®AMU200A (via the R&S®AMU-K69 option).

 

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